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ABSTRACT
ISSN: 0975-4024
Title |
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Test Generation for a System of Communicating Finite State Machines |
Authors |
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Qi-Ping Yang, Tae-Hyong Kim |
Keywords |
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Communicating FSM, Test generation, Full fault coverage, Test sequence reduction, Observable product machine |
Issue Date |
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Aug-Sep 2013 |
Abstract |
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A system of communicating finite state machines (SCFSM) is a usual design model of a complicated system composed of multiple communicating components. SCFSM testing usually depends on finite state machine (FSM) testing as an SCFSM can be converted to an equivalent FSM. SCFSM testing, however, should consider the properties of SCFSMs which are different from those of component FSMs. This paper proposes a test generation method for SCFSMs by analysing their properties. For the full fault coverage, SCFSM testing requires very long test sequences for detecting state addition faults. In order to reduce such test sequences, the proposed test case generation method uses individual reliable resets of component FSMs. |
Page(s) |
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3504-3513 |
ISSN |
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0975-4024 |
Source |
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Vol. 5, No.4 |
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