e-ISSN : 0975-3397
Print ISSN : 2229-5631
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ABSTRACT

Title : Design Patterns: A Resource for Reverse Engineering
Authors : P. Niranjan Reddy, Jayadev Gyani, P.R.K. Murti
Keywords : Design pattern, extraction, structural metrics, matching .
Issue Date : May 2010
Abstract :
Design patterns are gaining popularity because they support modifiability and flexibility of designs. Design patterns are solutions to frequently recurring problems in design. Reverse engineering of source code primarily focuses on the software architecture. Understanding software architecture in terms of design patterns simplifies the process of identifying some key properties such as coupling, flexibility and maintainability. This paper presents a novel approach to extract design patterns using structural metrics of object-oriented programs. It involves two steps. In the first step, structural metrics are extracted from the source code. In the second step, these metrics are matched with the properties of structural design patterns of Gang-of-Four to identify a design pattern. Our approach is demonstrated by extracting design patterns from a Java program using our pattern extraction tool.
Page(s) : 826-830
ISSN : 0975–3397
Source : Vol. 2, Issue.3

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